Semiconductor device and method for manufacturing the same

ABSTRACT

A COF which can effectively dissipate the heat by using a simple structure and its manufacturing method. A semiconductor device of COF, which is formed over the main surface of a flexible substrate having no device hole and where a semiconductor chip is mounted over the inner lead interconnection, is characterized by forming a first resin layer over the second main surface of the flexible substrate opposite the side where the semiconductor chip is mounted and at the position corresponding to the semiconductor chip.

FIELD OF THE INVENTION

The present invention relates to a structure of a semiconductor devicefor driving a flat panel display and a manufacturing method thereof and,specifically, relates to a structure of a COF (Chip On Film) and amanufacturing method thereof.

BACKGROUND OF THE INVENTION

In a flat panel display, notably a liquid crystal display and a plasmadisplay, one where a semiconductor chip is mounted over a circuitsubstrate having flexibility (a flexible substrate; hereinafter, it iscalled a base film) has been widely used for a semiconductor device fordriving them.

In general, as a semiconductor device for driving which achieves a highdensity for packaging semiconductor chips, there is a TCP (Tape CarrierPackage) and, in particular, one where there is no device hole and wherean inner lead connected with a bump electrode over the semiconductorchip makes contact with the base film, which is the substrate, is a COF(Chip On Film: hereinafter, it is called COF). On the other hand, a TCPin a narrow sense is used as a word to distinguish itself from a COF, inwhich there is a device hole formed by cutting the tape substrate andthere is a connection between the inner lead existing at the device hole(it is called a flying lead) and the terminal of the semiconductor chip.Hereinafter, when it is only called TCP, it means this TCP in a narrowsense.

Since the COF has the aforementioned structure, it is different from theTCP and has no flying lead which is easily bent; it can make the leadthinner; it has features where the etching characteristics of thecircuit interconnection layer is improved and a fine pitch process iseasily applied. Therefore, in recent years this COF has been mainstream.

On the other hand, in a flat panel display for a wide screen televisionset, there is a concern that the reliability of the semiconductor deviceis impaired by heat produced from the semiconductor device for drivingand that the display quality is impaired by propagation of the heat tothe flat panel display.

Conventionally, as a means for heat dissipation of this COF,JP-A-2006-108356 and JP-A-2006-64939 disclose a technology where ametallic heat radiating body and heat radiating tape are attached overthe rear surface of the base film.

Moreover, although it is not a COF, a conventional heat dissipationmeans will be described for reference purposes. As a technology forcontacting a cooling material directly with the rear surface of thesemiconductor chip, JP-A-2003-303928 discloses a technology where therear surface of a semiconductor ship is covered with paint and a tape,and JP-A-Hei06 (1994)-310621 discloses a technology where a cooling bodyis attached over the rear surface of a semiconductor chip.

Next, there is a technology related to a change of the material and thestructure of a surface protection film of a semiconductor element. InJP-A-2005-276943, a technology is disclosed in which a solder-resistcoated as an insulation of the conventional circuit interconnectionlayer is replaced by a liquid ceramic; JP-A-Hei10(1998)-125834 disclosesa technology for sealing a semiconductor element by using double resins;and JP-A-Hei08 (1996)-279567 and JP-A-Hei08 (1996)-279533 disclose atechnology where a semiconductor element is covered with a metalliclayer having a low melting-point.

SUMMARY OF THE INVENTION

In order to reduce the cost of a semiconductor device for driving, it isrequired that many driving circuits are integrated in a chip. However,the aforementioned heat generation increases in proportion to the numberof the driving circuits. In general, in a self-heat-producingsemiconductor device, a cooling mechanism such as a cooling body isusually provided for making contact with the package, but thecost-increase caused by the cooling mechanism conflicts with theoriginal purpose of cost-reduction.

In the aforementioned JP-A-2006-108356 to JP-A-Hei08 (1996)-279533,there is no technology that can dissipate heat inexpensively andefficiently by using a simple structure and manufacturing method.

In a semiconductor device where a semiconductor chip is mounted over afirst surface of a flexible substrate which does not have a device hole,the present invention is characterized by forming a resin layer over thesecond surface of the flexible substrate opposite the side where thesemiconductor chip is mounted and at the position corresponding to thesemiconductor chip.

A manufacturing method of the present invention includes the steps formounting a semiconductor chip over the first surface of the flexiblesubstrate and forming a resin layer by a resin printing technique overthe second surface of the flexible substrate and at the position of thesemiconductor chip.

A semiconductor device of the present invention has a resin layer, not ametallic plate, over the rear surface of a COF package and the resinlayer achieves heat dissipation.

A case is considered in which a production line for manufacturing TCP isswitched over to a production line for manufacturing COF. Resinformation using a printing technique is typically applied to resinsealing for TCP. On the other hand, a printing technique cannot beapplied to a resin sealing technique for COF and a kind of pottingtechnique, a so-called under-fill, is generally used for it. In otherwords, if the production line is switched over, the equipment for resinforming using the printing technique becomes an idle facility.

The present invention therefore provides a COF which can efficientlydissipate heat by using a simple structure and manufacturing method anda manufacturing method thereof without the need for making new capitalinvestment and by using existing facilities and components.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a cross-sectional view according to a first embodiment of thepresent invention;

FIGS. 2(1)-(5) are manufacturing method 1 according to the presentinvention (the case of a TCP bonder);

FIGS. 3(1)-(5) are manufacturing method 2 according to the presentinvention (the case of a COF bonder);

FIG. 4A is a perspective view from the semiconductor chip mount sideaccording to a second embodiment of the present invention;

FIG. 4B is a perspective view from the reverse side according to thesecond embodiment of the present invention;

FIG. 5 is a cross-sectional view of the second embodiment of the presentinvention; and

FIG. 6 is a graph showing thermal simulation results.

DETAIL DESCRIPTION OF THE PREFERRED EMBODIMENTS

Hereafter, preferred embodiments of the present invention will bedescribed with reference to the following drawings. FIG. 1 is across-sectional drawing of a COF 100 related to the first embodiment ofthe present invention.

As shown in FIG. 1, the COF 100 of the first embodiment includes a basefilm 1, a circuit interconnection layer 2, a solder-resist 3, asemiconductor chip 4, a sealing resin layer 5, and a heat radiatingresin layer 6.

The semiconductor chip 4 is connected over the base film 1, on which thecircuit interconnection layer 2 is formed, with the surface down througha bump electrode 7. The heat radiating resin layer 6 which is the firstresin layer is formed at the opposite side (rear side) of the circuitinterconnection layer 2 over the base film 1. Moreover, the sealingresin layer 5 which is the second resin layer is formed between thesurface of the semiconductor chip 4 and the base film 1.

The resin material of the heat radiating resin layer 6 may be the sameas the resin for sealing the semiconductor chip 4 and one includingfiller may be acceptable when spreading the resin is difficult tocontrol and when there is an attempt to improve the effects of heatdissipation.

Accordingly, a COF which has better heat dissipation and excellentinsulation performance can be formed by providing a heat radiating layermade of a resin.

FIG. 2 and FIG. 3 show a method for manufacturing the COF 100 composedas above.

FIG. 2 is a case where a bonder for TCP is used and FIG. 3 is a casewhere a bonder for COF is used when the COF 100 of the invention ismanufactured.

At first, the case for using a bonder for TCP is described in FIG. 2.

Over the circuit interconnection layer 2, except for the region wherethe semiconductor chip 4 is mounted and the pad, the semiconductor chip4 is connected to a base film 1 where the solder resist 4 is formed. Forinstance, the connection method is one where gold at the surface of thebump electrode 7 of the semiconductor chip 4 is connected to tin at theinner lead surface of the circuit interconnection layer 2 by a gold-tineutectic crystal (inner lead bonding).

Concretely, the semiconductor chip 4 is put on the bonding equipmentwith the surface facing upward; alignment is performed between the bumpelectrode 7 of the semiconductor chip 4 and the inner lead of thecircuit interconnection layer 2 in the form of covering the base film 1thereon with the circuit interconnection layer 2 side down; and they areconnected to each other by pressing under the conditions of heat (it isnot shown in the figure).

Next, the heat radiating resin layer 6 is formed by using a resinprinting technique on the reverse side (rear side) of the face of thebase film 1 where the semiconductor chip 4 is mounted (refer to FIG. 2(2)). Herein, of special note is that the resin printer for performingthis resin printing is used for formation of the heat radiating resinlayer 6. In other words, this resin printer is used for forming thesealing resin layer 5 for a TCP and it is never used for a COF. Thereason is that a part where the resin does not enter is created betweenthe semiconductor chip 4 and the base film 1 because of themanufacturing method thereof in a COF which does not have a device hole.It is important that the heat radiating resin layer 6 is formed byeffectively using the resin printer which becomes an idle facility whenthe TCP is switched over to the COF.

Moreover, in order to perform effective heat dissipation, it isnecessary that the heat radiating resin layer 6 be formed through thebase film 1 over the right rear surface of the position where thesemiconductor chip 4 is mounted. Then, it is necessary to align thesurface where the semiconductor chip 4 is mounted over the heatradiating resin layer 6. In general, the chips are aligned at fixedpitches in the tape carrier package and feeding the tape (base film) isperformed with reference to the sprocket holes. Therefore, when theposition of the first chip is determined, alignment can be easilyperformed accurately by using the mechanical position information fromthe sprocket. Moreover, it is possible to align them by using positioninformation from the recognition hole and the pattern (transmittedlight).

The resin material can be managed collectively when a silicon system orpolyamide system epoxy resin similar to the sealing resin layer 5 isused.

Moreover, in order to improve the effect of heat dissipation, it iseffective to use a material having insulation performance and highthermal conductivity as filler. For instance, a metallic oxide which hasinsulation performance such as ferrite powder and diamond powder whichhas high thermal conductivity may be used as filler. Moreover, if thereis no problem in the insulation performance, metallic powder may be usedas filler and it may be possible to mix a metallic oxide, diamondpowder, and metal powder and use it as filler.

Furthermore, the larger size of the heat radiating resin layer 6 themore effective is the heat dissipation. However, the preferable sizethereof is one similar to the sealing resin layer 5. When it is mountedin a flat panel display unit, the base film is bent and mounted to makethe chip mounting side inside. Therefore, the bending part which has theflexibility of the base film 1 is limited by the size of the sealingresin layer 5. However, when the size of the heat radiating resin layer6 is larger than the size of the sealing resin layer 5, the part whichhas the flexibility of the base film 1 is limited by the size of theheat radiating resin layer 6. In some cases, changes are created in themechanism itself of the flat panel display unit. Therefore, the size ofthe heat radiating resin layer 6 is preferably controlled to be theextent of the size where the part having flexibility of the base film 1is limited by the size of the sealing resin layer 5, that is, the sizeof the sealing resin layer 5.

Next, the heat radiating resin layer 6 is pre-cured by performing theheat treatment (refer to FIG. 2 (3)).

Next, the base film 1 is reversed to be arranged so that the mountingsurface of the semiconductor chip 4 is facing up and the surface, wherethe heat radiating resin layer 6 is formed, is facing down. Afterwards,the sealing resin layer 5 is formed by potting between the semiconductorchip 4 and the base film 1 in order to protect it from humidity orpollution, etc. of the surrounding environment. For instance, an epoxyresin is used for a resin material (refer to FIG. 2 (4)).

This sealing resin layer 5 is cured by performing the heat treatment(refer to FIG. 2 (5)).

After passing the inspection process, the COF 100 is completed (refer toFIG. 1).

Next, the case where a bonder for COF is used will be described in FIG.3.

Herein, the only difference between the manufacturing methods of a TCPbonder and a COF bonder is the order of the formation of the heatradiating resin layer 6. Therefore, as long as there is no specificdescription, the manufacturing method of a COF bonder is common withthat of a TCP bonder, so that detailed descriptions are omitted.

The base film 1 with the circuit interconnection layer 2 facing upwardis arranged over the bonding equipment and jointed to make the surfaceof the semiconductor chip 4 face down. Concretely, the bump electrode 7of the semiconductor chip 4 is connected with the inner lead of thecircuit interconnection layer 2 by using an inner lead bonding technique(refer to FIG. 3 (1)).

Afterwards, the sealing resin layer 5 is formed by potting between thesemiconductor chip 4 and the base film 1 in order to protect it fromhumidity or pollution, etc. of the surrounding environment (refer toFIG. 3 (2)).

Then, this sealing resin layer 5 is pre-cured by performing the heattreatment (refer to FIG. 3 (3)).

Then, the base film 1 is reversed to make the mounting surface of thesemiconductor chip 4 face down and the rear face of the mounting surfaceof the semiconductor chip 4 face up, and it is arranged over a resinfeeder line.

And, the heat radiating resin layer 6 is formed over the rear surface ofthe base film 1 corresponding to the position where the semiconductorchip 4 is mounted. In this case, as in the case of a TCP bonder, theresin printer which was used for sealing the semiconductor chip 4 isused when a TCP is manufactured and the heat radiating resin layer 6 isformed by using the resin printing technique (FIG. 3 (4)).

This heat radiating resin layer 6 is cured by performing the heattreatment (refer to FIG. 3 (5)).

After passing the inspection process, the COF 100 is completed (refer toFIG. 1).

FIGS. 4A and 4B are perspective views illustrating the COF 100 relatedto the second embodiment of the invention, and FIG. 5 is across-sectional drawing at A-A′ of FIG. 4.

The heat radiating resin layer 6 of the first embodiment has a stripshape. On the other hand, the point of the second embodiment of theinvention is that the heat radiating resin layer 6 has a grid shapewhere diced openwork is provided in order to increase the surface areaof the heat radiating resin layer 6 as shown in FIG. 4 and FIG. 5. Inaddition, the surface area may be increased by providing roughness suchas a dimpled shape or wave shape for the surface of the heat radiatingresin layer 6 when open work is not by provided. Roughness can be easilyformed by using a stamp when the heat radiating resin layer 6 ispre-cured. The means is not limited to this and the heat radiating resinlayer 6 may be divided into two or more.

Since the manufacturing method thereof and the material for the heatradiating resin are the same as the aforementioned first embodiment, thedescriptions will be omitted.

Finally, FIG. 6 shows the thermal simulation results. This is acomparison of the thermal simulation results between the prior art wherea heat radiating resin layer is not formed over the rear surface, thefirst embodiment, and the second embodiment. The conditions of thethermal simulation are determined with respect to an environment wherethey are surrounded by air.

As shown in FIG. 6, the present invention can suppress the increase inthe junction temperature compared with the prior art by forming a resinlayer over the rear surface of the COF. This is due to heat dissipationbeing increased by arranging the heat radiating resin layer 6 over therear surface.

Moreover, since it is clearly understood from the simulation results ofFIG. 6, more effective heat dissipation becomes possible in the secondembodiment compared with the first embodiment because it has a shapewhere the surface area is increased even if the resin thickness is thesame.

Since the heat radiating resin layer 6 is formed by effectively usingthe resin printer which becomes an idle facility when a TCP is switchedover to a COF in the present invention, existing facilities can be usedas is without the need for making new capital investment.

Moreover, when more effective heat dissipation is obtained, a materialhaving insulation performance and high thermal conductivity may be mixedin the resin as filler for the heat radiating resin layer 6. When thesealing resin layer 5 is formed, mixing filler having high thermalconductivity cannot be used because the gap between the semiconductorchip and the film is small and the filling becomes worse. However, inthis invention, since a resin printer is used for forming the heatradiating resin layer 6, formation of the sealing resin layer 5 andformation of the heat radiating resin layer 6 can be done independentlyand easily used properly. Therefore, it has a feature in which a sealingresin material and a heat radiating resin material can be selected underoptimized conditions as necessary. Moreover, in equipment where theinsulation performance of the heat radiating resin layer 6 does notbecome a problem, it is possible to use metallic filler having high heatdissipation.

Moreover, a COF of the present invention does not use specificmanufacturing facilities, so that both a conventional COF bonder and aTCP bonder can be easily manufactured.

In addition, when a sealing resin layer 5 and a heat radiating resinlayer 6 are made of the same material, the material can be managedcollectively.

Additionally, the heat radiating resin layer 6 is formed by using aproven resin printer for TCP, so that the adhesion between the base filmand the resin is as before and does not have any problems.

Moreover, since it is not a technique as in the prior art where aninsulating resin is formed over the heat radiating body made of a metaland the resin itself has both insulation performance and heatdissipation, the thickness of the semiconductor device can be madethinner.

Moreover, if a heat radiating resin layer which has almost the same sizeas the sealing resin layer is provided over the opposite side of thesemiconductor chip mounting surface, the part which has the flexibilityof the base film is not limited by the size of the heat radiating resinlayer, so that no change is made in the mechanism for mounting thesemiconductor device.

If the present invention is applied to a semiconductor for driving aflat panel display, it is possible to make the pitch finer and reducethe cost, and COF can be achieved in which effective heat dissipation ispossible.

1. A semiconductor device, comprising: a semiconductor chip mounted overa first surface of a continuous flexible substrate, wherein a firstresin layer is formed over a second surface of said continuous flexiblesubstrate opposite a side where the semiconductor chip is mounted and ata position corresponding to said semiconductor chip, wherein a secondresin layer is filled between said continuous flexible substrate andsaid semiconductor chip, and wherein said first resin layer comprises adivided plurality of resins or a resin which has one or more slits.
 2. Asemiconductor device, comprising: a semiconductor chip mounted over afirst surface of a continuous flexible substrate, wherein a first resinlayer is formed over a second surface of said continuous flexiblesubstrate opposite a side where the semiconductor chip is mounted and ata position corresponding to said semiconductor chip, wherein a secondresin layer is filled between said continuous flexible substrate andsaid semiconductor chip, and wherein said first resin layer has asurface with roughness.
 3. A semiconductor device, comprising: asemiconductor chip mounted over a first surface of a continuous flexiblesubstrate, wherein a first resin layer is formed over a second surfaceof said continuous flexible substrate opposite a side where thesemiconductor chip is mounted and at a position corresponding to saidsemiconductor chip, wherein a second resin layer is filled between saidcontinuous flexible substrate and said semiconductor chip, and whereinsaid first resin layer has substantially the same size as said secondresin layer.
 4. A semiconductor device, comprising: a semiconductor chipmounted over a first surface of a continuous flexible substrate, whereina first resin layer is formed over a second surface of said continuousflexible substrate opposite a side where the semiconductor chip ismounted and at a position corresponding to said semiconductor chip,wherein a second resin layer is filled between said continuous flexiblesubstrate and said semiconductor chip, and wherein said first resinlayer and said second resin layer include different materials havedifferent fillers.